Abstract
The Yeh’s 4×4 matrix formalism is applied to determine the
electromagnetic wave response in multilayers with arbitrary magnetization. With restriction to
magneto–optic (MO) effects linear in the off–diagonal permittivity tensor
elements, a simplified characteristic matrix for a magnetic layer is obtained. For a magnetic
film–substrate system analytical representations of the MO response expressed in
terms of the Jones reflection matrix are provided. These are numerically evaluated for cases
when the magnetization develops in three mutually perpendicular planes.
©2001 Optical Society of America
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