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Subsurface defect detection in materials using optical coherence tomography

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Abstract

We have used optical coherence tomography to study the internal structure of a variety of non-biological materials. In particular, we have imaged internal regions from a commercial grade of lead zirconate titanate ceramic material, from a sample of single-crystal silicon carbide, and from a Teflon-coated wire. In each case the spatial positions of internal defects were determined.

©1998 Optical Society of America

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Supplementary Material (3)

Media 1: MOV (810 KB)     
Media 2: MOV (729 KB)     
Media 3: MOV (1038 KB)     

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Figures (5)

Fig. 1.
Fig. 1. Reflection (a) and transmission (b) micrographs of a silicon nitride PZT ceramic sample 4 mm thick. There is a defect in the center of the image, and a larger, low contrast discoloration surrounding the defect.
Fig. 2.
Fig. 2. A movie of 13 separate OCT scans taken at various depths from the same region of the sample shown in Fig. 1. The OCT scans are taken in the X-Y plane (parallel to the surface of the ceramic) at the depths shown in the lower right hand corner of each frame. Zero microns represents the approximate surface of the sample. [Media 1]
Fig. 3.
Fig. 3. A transmission micrograph of a single-crystal silicon carbide sample.
Fig. 4.
Fig. 4. A movie showing various three-dimensional views of OCT data from 15 different X-Y scans in the silicon carbide sample shown in Fig. 3. The scan range in X and Y is 1 mm . The X-Y scans were taken 10 μm apart in depth. The colored regions represent areas of high scatter. [Media 2]
Fig. 5.
Fig. 5. A movie of 29 separate OCT scans taken at 100 μm intervals along a teflon-coated copper wire. The OCT scans are taken in the X-Z direction (cross-sections of the wire). [Media 3]
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