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The variation of the enhanced photoluminescence efficiency of Y2O3:Eu3+ films with the thickness to the photonic crystal layer

Ki-Young Ko, Young Kwang Lee, Hoo Keun Park, Yoon-Chang Kim, and Young Rag Do

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Abstract

This study examined the effects of the thickness of Y2O3:Eu3+ phosphor films on quartz substrates coated with two-dimensional (2D) SiO2 square-lattice nanorod photonic crystal layers (PCL) at identical heights on their extraction and absorption efficiency. The photoluminescence (PL) efficiency enhancement ratio decreased exponentially with increasing Y2O3:Eu3+ film thickness. The 2D PCL-assisted Y2O3:Eu3+ film with a thickness (t)=400 nm showed enhancement in the upward and downward PL emission by factors of 6.2 and 8.6, respectively, with respect to those of a conventional flat film. This observation was attributed to diffraction scattering of the excitation and emission light.

©2008 Optical Society of America

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Figures (5)
Fig. 1.
Fig. 1. Schematic diagram of a Y2O3:Eu3+ thin film coated on a 2D SiO2 photonic crystal layer on a quartz glass substrate with a lattice constant, Λ, a nanorod height, h, a diameter, d, and a film thickness, t, as well as the light paths of the three different forms of emitted light: upward (top phosphor side) emission, downward (bottom quartz side) emission, and guided (edge side) emission.

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Fig. 2.
Fig. 2. Cross-sectional and top view FE-SEM images (insets) of the Y2O3:Eu3+ thin films of various thicknesses (t) on quartz substrates modified with 2D SiO2 PC nanorod arrays (lattice constant, 600 nm; height, 200 nm; diameter, 300 nm): (a) 200 nm; (b) 400 nm; (c) 2 µm; (d) 4 µm. Scale bar: 500nm.

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Fig. 3.
Fig. 3. The relative photoluminescence intensity of the downward emissions of flat and 2D PCL-assisted Y2O3:Eu3+ films as a function of the thickness of the Y2O3:Eu3+ films deposited on identical height PCLs (200 nm). The inset shows the emission spectra resulting from integrated PL measurements of 2D PCL-coated Y2O3:Eu3+ TFPs with excitation at 254 nm and t=400 nm and of a flat conventional film.

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Fig. 4.
Fig. 4. The measured and calculated upward and downward emitted PL light efficiencies for Y2O3:Eu3+ films relative to those of flat samples as a function of the Y2O3:Eu3+ film thickness on identical height PCLs (200 nm). The inset shows actual photographs (taken with a Samsung camera, model #11) of the side views of the flat and 2D PCL-assisted TFPs with t=400 nm under illumination at 254 nm (SPECTROLINE mercury lamp, MODEL ENF-2400C/FE).

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Fig. 5.
Fig. 5. (a). The relative of absorption intensity at 254 nm of both the flat and 2D PCL assisted Y2O3:Eu3+ films, and (b) the measured downward emitted PL emission efficiency ratios, extraction efficiency ratios and absorption efficiency ratios of the 2D PCL assisted Y2O3:Eu3+ films relative to those of the flat samples as a function of the Y2O3:Eu3+ film thickness on the identical height PCLs (200 nm).

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Equations (2)

Equations on this page are rendered with MathJax. Learn more.

E R = A exp ⁡ ( − ( t / h ) / a ) + E R 0
Δ η t o t . e x t . = Δ η P C L e x t r . ⋅ Δ η P C L a b s o r p .
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