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Simultaneous measurement of phase retardation and optic axis of a phase compensation film using an axially-symmetric sheared polymer network liquid crystal

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Abstract

A new method for simultaneously measuring the phase retardation and optic axis of a uniaxial compensation film is demonstrated using an axially-symmetric sheared polymer network liquid crystal (SPNLC). By overlaying a tested compensation film with a calibrated SPNLC cell between crossed polarizers, two dark spots are clearly observed in a CCD image. From the orientation direction and distance of these two spots, the optic axis and phase retardation value of the compensation film can be determined. This method is particularly useful for those optical systems whose optic axis and phase retardation are dynamically changing.

©2005 Optical Society of America

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Figures (8)

Fig. 1.
Fig. 1. The illustration of the off-axis shearing of the SPNLC cell
Fig. 2.
Fig. 2. (a) The LC director profile of a SPNLC layer, and (b) Detected image under crossed polarizers.
Fig. 3.
Fig. 3. Phase retardation (dΔn) profile of the axially-symmetric SPNLC layer. Cell gap d=9 μm.
Fig. 4.
Fig. 4. (a)Measurement setup and (b) illustration of the measurement methods.
Fig. 5.
Fig. 5. (a) The transmitted image recorded by a CCD camera, and (b) the converted transmittance distribution.
Fig. 6.
Fig. 6. (a) The relative distance of the two transmission minima recorded by a CCD camera. (b) The corresponding phase retardation of the quarter-wave film.
Fig. 7.
Fig. 7. CCD images taken under three different color filters (a) 486 nm, (b) 532 nm, and (c) 632 nm.
Fig. 8.
Fig. 8. (a) A movie shows the real dynamic image changes when the quarter-wave plate rotates at different angles (377 KB) (b) The simulation result shows the same trend when we rotate the slow axis of the quarter-wave plate from 0° to 135° (368 KB).

Equations (2)

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Γ R , slow Γ S , fast = 0
Γ R , slow + Γ S , slow =
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