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Improving low-temperature performance of infrared thin-film interference filters utilizing the intrinsic properties of IV–VI narrow-gap semiconductors

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Abstract

Pb1-xGexTe is a pseudobinary alloy of IV–VI narrow-gap semiconductor, of which maximum refractive index corresponds to the ferroelectric phase transition. Since the temperature coefficient of refractive index can be tunable from negative to positive by changing the Ge composition, it is possible to utilize the intrinsic property in the fabrication of infrared thin-film interference filters. In this letter, we report a narrow-bandpass filter, in which Pb0.94Ge0.06Te was substituted for PbTe. It found that the low-temperature stability of the filter is obviously improved: in the temperature range of 80-300K, the shift of center wavelength with temperature is reduced from 0.48nm. K-1 to 0.23nm K-1; furthermore, the peak transmittance of filter fabricated with Pb0.94Ge0.06Te is ~3% over that fabricated with PbTe.

©2004 Optical Society of America

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Figures (2)

Fig. 1.
Fig. 1. (a) Low-temperature spectral characteristics of the filter fabricated with Pb0.94Ge0.06Te; (b) Low-temperature spectral characteristics of the filter fabricated with PbTe.
Fig. 2.
Fig. 2. Comparison of center wavelength and peak transmittance versus temperature for two filters (square and up-triangle are for the filter fabricated with Pb0.94Ge0.06Te; circle and down-triangle are for that fabricated with PbTe)
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