Abstract

In this study, a hollow optical waveguide with omni-directional reflectors in silicon-based materials was design, fabricated and characterized. By using dry etching technique, plasma-enhanced chemical vapor deposition for Si/SiO₂ thin films and covering another wafer with omni-directional reflector together, the waveguides can be formed with an air core of 1.2mm×1.3mm. A uniform propagation loss of the waveguide to be around 1.7dB/cm for C+L band was found for the TE and TM modes. Polarization-independent hollow optical waveguides were obtained with the hollow waveguide structure.

©2004 Optical Society of America

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