Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Trapping force and optical lifting under focused evanescent wave illumination

Open Access Open Access

Abstract

A physical model is presented to understand and calculate trapping force exerted on a dielectric micro-particle under focused evanescent wave illumination. This model is based on our recent vectorial diffraction model by a high numerical aperture objective operating under the total internal condition. As a result, trapping force in a focused evanescent spot generated by both plane wave (TEM00) and doughnut beam (TEM* 01) illumination is calculated, showing an agreement with the measured results. It is also revealed by this model that unlike optical trapping in the far-field region, optical axial trapping force in an evanescent focal spot increases linearly with the size of a trapped particle. This prediction shows that it is possible to overcome the force of gravity to lift a polystyrene particle of up to 800 nm in radius with a laser beam of power 10 µW.

©2004 Optical Society of America

Full Article  |  PDF Article
More Like This
Strong tangential force within a small trapping volume under near-field Laguerre-Gaussian beam illumination

Baohua Jia, Xiaosong Gan, and Min Gu
Opt. Express 16(19) 15191-15197 (2008)

Optical trapping force with annular and doughnut laser beams based on vectorial diffraction

Djenan Ganic, Xiaosong Gan, and Min Gu
Opt. Express 13(4) 1260-1265 (2005)

Exact radiation trapping force calculation based on vectorial diffraction theory

Djenan Ganic, Xiaosong Gan, and Min Gu
Opt. Express 12(12) 2670-2675 (2004)

Cited By

Optica participates in Crossref's Cited-By Linking service. Citing articles from Optica Publishing Group journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1.
Fig. 1. Trapping efficiency mapping for a small and a large polystyrene particle of radius a, scanned in the X direction (light polarization direction) across the focused evanescent field. NA=1.65, λ=532 nm, ε=0.85, n 1=1.78 and n 2=1.33.
Fig. 2.
Fig. 2. The calculated and measured maximal TTE of a polystyrene particle of 1 µm in radius as a function of the obstruction size ε for P and S scanning directions under plane wave and the doughnut beam illumination. The other conditions are the same as Fig. 1.
Fig. 3.
Fig. 3. (a) The maximal ATE of a polystyrene particle of 1 µm in radius as a function of the obstruction size ε. (b) Dependence of the ATE on the virtual focus position for a small and large polystyrene particle (ε=0.85). The inset shows the phase of the Fresnel transmission coefficients as a function of the incident angle. The other conditions are the same as Fig. 1.
Fig. 4.
Fig. 4. (a) The maximal ATE as a function of a polystyrene particle size (ε=0.85). The inset shows a schematic relation between the interaction cross-section area and the particle size. (b) The magnitudes of the axial force for a plane wave of power 10 µW and the gravity force for different particle sizes. The other conditions are the same as Fig. 1.
Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.