Abstract
The planar waveguides have been fabricated in fused quartz by 3.0 MeV oxygen ion implantation at dose of 1×1015ions/cm2. The guiding modes were observed at wavelengths of both 633 nm and 1539 nm before and after annealing at 320°C, 450°C and 500°C in 60 min characterized by the prism-coupling method. The width of the waveguide structure induced by oxygen ion implantation is about 3 microns. After suitable annealing, the minimum propagation loss of the waveguide in fused quartz can be reduced to -0.14 dB/cm.
©2004 Optical Society of America
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