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Carrier-envelope-phase stabilized chirped-pulse amplification system scalable to higher pulse energies

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Abstract

We have demonstrated a carrier-envelope phase (CEP) stabilized chirped-pulse amplification (CPA) system employing a grating-based pulse stretcher and compressor and a regenerative amplifier for the first time. In addition to stabilizing the carrier-envelope offset phase of a laser oscillator, a new pulse selection method referenced to the carrier-envelope offset beat signal was introduced. The pulse-selection method is more robust against the carrier-envelope offset phase fluctuations than a simple pulse-clock dividing method. We observed a stable fringe in a self-referencing spectrum interferometry of the amplified pulse, which implies that the CEP of amplified pulse is stabilized. We also measured the effect of the beam angle change on the CEP of amplified pulses. The result demonstrates that the CEP stabilized CPA is scalable to higher-pulse energies.

©2004 Optical Society of America

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Figures (13)

Fig.1.
Fig.1. Electric field and the envelope of few-cycle optical pulse
Fig. 2.
Fig. 2. Diagram of the CEP stabilized CPA system
Fig. 3.
Fig. 3. Self-referencing f-to-2f interferometer.DM: dichroic mirror, PBS: polarizing beam splitter, Pol: polarizer, G: grating, APD: Avalanche photodiode
Fig. 4.
Fig. 4. Stability of the PLL-controlled CEO signal. (a) Stability of the controlled CEO beat signal (V CEO) relative to the reference signal (V ref) measured with an ocilloscope. (b) Power spectrum density of the phase noise (S ϕ) measured with a vector signal analyzer and the phase error calculated from integration of S ϕ.
Fig. 5.
Fig. 5. (a) Calculation of the self-referencing SI signal for different CEP value. (b) Trace of the intensity at 400 nm component, which shows sinusoidal intensity modulation corresponding to the CEO beat signal.
Fig. 6.
Fig. 6. CEP error of the selected pulse as a function of the delay between the divider and the ready pulse
Fig. 7.
Fig. 7. (a) Measurement of the CEP jitter of regenerative amplifier seed pulses. The delay between the divider and the ready pulse was 3.4 μs. The upper distribution (blue) shows the histogram of the timing jitter of V ceo. (b) Histogram of the CEP error (red dots) and the fitted Gaussian distribution with σ=0.42rad (dotted line).
Fig. 8.
Fig. 8. Spectrum of CEP stabilized amplified pulse
Fig. 9.
Fig. 9. (a) Spectrum of the output pulse from the hollow-core fiber filled with Kr gas. (b) Spectrum of the fundamental component and the second harmonic component after the second harmonic crystal. (c) Self-referencing spectrum for the CEP-stabilized pulses. f Amp=762Hz, and the exposure time of CCD was set 21msec (16 pulses for one exposure)
Fig. 10.
Fig. 10. Self-referencing SI of amplified pulse. 1-sec integrated spectrum (upper), and temporal evolution of the fringe (lower). f Amp = 762Hz, Exposure time of CCD is 21 msec (16 pulses for one exposure). (a) Measured with the CEP of the seed pulse was not stabilized, and (b) measured with the CEP of seed pulses was stabilized.
Fig. 11.
Fig. 11. Self-referencing SI of amplified pulse. (a) 10-sec integrated spectrum (upper), and temporal evolution of the fringe (lower). f Amp=762Hz, Exposure time of CCD is 21 msec (16 pulses for one exposure). (b) Comparison of the integrated spectra for different integration periods.
Fig. 12.
Fig. 12. (a) Temporal evolution of self-referencing SI fringe measured with changing the CEP of the seeding pulse by changing the delay of the f-to-2f interferometer by 1.7 μm at 1Hz. The fringe shows phase shift of 16.9rad. (b) Observed CEP shift as a function of the calculated CEP shift from the delay in the f-to-2f interferometer. The slope is 0.76.
Fig. 13.
Fig. 13. (a) Temporal evolution of self-referencing SI fringe measured with changing the beam direction to the pulse stretcher. Peak to peak angle change was 84 μrad and measured fringe (CEP) shift was 7.0rad. (b) Measured fringe shift as a function of the peak to peak angle change. The slope is 8.3×104 rad/rad

Equations (3)

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ϕ error = ν high ν low S ϕ d v
I ( ω ) = I F ( ω ) + I SH ( ω ) + 2 I F ( ω ) I SH ( ω ) cos ( ω τ + ϕ + ϕ const )
Δ ϕ cep , AP = C AP P ( Δ P P )
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